Bazu, M.: search on Z-Library

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1

[IEEE 2004 International Semiconductor Conference. CAS 2004 - Sinaia, Romania (4-6 Oct. 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - Screening the reliable semiconductor chips by laser acceleration of deep level recombination. Process certification for industrial application

Galateanu, L., Bazu, M., Ilian, V., Tibeica, C., Petu, A., Apostol, D., Damian, V.

Year:

2004

Language:

english

File:

PDF, 350 KB

english, 2004

2

Geographic variations in the whistles of spinner dolphins (Stenella longirostris) of the Main Hawai[reverse prime]ian Islands

Bazúa-Durán, Carmen, Au, Whitlow W. L.

Journal:

The Journal of the Acoustical Society of America

Year:

2004

Language:

english

File:

PDF, 1.02 MB

english, 2004

3

The whistles of Hawaiian spinner dolphins

Bazúa-Durán, Carmen, Au, Whitlow W. L.

Journal:

The Journal of the Acoustical Society of America

Year:

2002

Language:

english

File:

PDF, 324 KB

english, 2002

4

[IEEE MELECON '94. Mediterranean Electrotechnical Conference - Antalya, Turkey (12-14 April 1994)] Proceedings of MELECON '94. Mediterranean Electrotechnical Conference - Analysis of the defects induced by boron implantation in silicon after sequential annealing processes

Plugaru, R., Gaiseanu, F., Bazu, M., Nistor, L.C.

Year:

1994

Language:

english

File:

PDF, 193 KB

english, 1994

5

[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Building-in reliability technology for diodes manufacturing

Bazu, M., Udrea-Spenea, M., Tsoi, E., Turtudau, F., Ilian, V., Papaioannou, G., Galateanu, L., Stan, A., Tserepi, A., Bucur, M.

Year:

2000

Language:

english

File:

PDF, 374 KB

english, 2000

6

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Reliability tests for discriminating between technological variants of QFN packaging

Bazu, Marius, Ilian, Virgil Emil, Varsescu, Dragos, Galateanu, Lucian, Sikio, Vili, Reimets, Meelis, Uhl, Volker, Weiss, Manuel

Year:

2013

Language:

english

File:

PDF, 678 KB

english, 2013

7

[IEEE 2014 International Semiconductor Conference (CAS) - Sinaia, Romania (2014.10.13-2014.10.15)] 2014 International Semiconductor Conference (CAS) - Thermographic analysis with enhanced emissivity

Varsescu, D., Ilian, V. E., Bazu, M.

Year:

2014

Language:

english

File:

PDF, 816 KB

english, 2014

8

Microbial Applications (Recent Advancements and Future Developments) || 2. Microbial applications for fabric and textile industries

Kumar Gupta, Vijai, Zeilinger, Susanne, Ferreira Filho, Edivaldo X., Carmen Durán-Dominguez-de-Bazu, Maria, Purchase, Diane

Year:

2016

File:

PDF, 658 KB

2016

9

Microbial Applications (Recent Advancements and Future Developments) || 9. Use of tetracyclines and β-lactams in agriculture: Fate in the environment and occurrence of antibiotic-resistance determinants

Kumar Gupta, Vijai, Zeilinger, Susanne, Ferreira Filho, Edivaldo X., Carmen Durán-Dominguez-de-Bazu, Maria, Purchase, Diane

Year:

2016

File:

PDF, 129 KB

2016

10

Measurement of the effects of the reactivity of materials in a fast reactor

V. R. Nargundkar, T. K. Bazu, K. Chandramoleshvar, P. K. Dzhob, Rao K. Subba

Journal:

Year:

1977

Language:

english

File:

PDF, 358 KB

english, 1977

11

[IEEE 2005 International Semiconductor Conference - Sinaia, Romania (3-5 Oct. 2005)] CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005. - Analytical vs. computational approach of the pull-in voltage of electrostatically actuated micro-bridges

Tibeica, C., Voicu, R., Bazu, M., Ilian, V.E., Vasilache, D., Galateanu, L., Pons, P., Yacine, K., Flourens, F.

Year:

2005

Language:

english

File:

PDF, 1.96 MB

english, 2005

12

[IEEE 2004 24th International Conference on Microelectronics - Nis, Serbia (16-19 May 2004)] 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) - Concurrent Engineering - a tool for improving MEMS research and manufacturing

Year:

2004

Language:

english

File:

PDF, 542 KB

english, 2004

13

[IEEE International Semiconductor Conference - Sinaia, Romania (8-12 Oct. 2002)] Proceedings. International Semiconductor Conference - Evaluation of semiconductor devices aging from in core flux detector amplifier used in nuclear power plants equipment

Ilian, V.E., Dragan, M., Bazu, M., Oprea, M., Oprea, I., Stoica, M., Parvu, I.

Year:

2002

Language:

english

File:

PDF, 220 KB

english, 2002

14

[IEEE International Conference on Computational Intelligence for Modelling, Control and Automation and International Conference on Intelligent Agents, Web Technologies and Internet Commerce (CIMCA-IAWTIC'06) - Vienna, Austria (28-30 Nov. 2005)] International Conference on Computational Intelligence for Modelling, Control and Automation and International Conference on Intelligent Agents, Web Technologies and Internet Commerce (CIMCA-IAWTIC'06) - Fuzzy-Logic Reliability Predictions in Microtechnologies

Bazu, M., Tibeica, C., Galateanu, L., Ilian, V.E.

Year:

2005

Language:

english

File:

PDF, 194 KB

english, 2005

15

Generation of the P-Induced Misfit Dislocations during the Diffusion in Silicon: Analytical Determination of the Criticy Conditions

Gaiseanu, F., Plugaru, R., Bazu, M., Buiu, O.

Journal:

Solid State Phenomena

Year:

1993

File:

PDF, 323 KB

1993

16

[IEEE 1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings - Sinaia, Romania (9-12 Oct. 1996)] 1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings - Can you deliver the semiconductor devices after performing periodic tests?

Dragan, M., Bazu, M.

Year:

1996

Language:

english

File:

PDF, 299 KB

english, 1996

17

[IEEE 2006 25th International Conference on Microelectronics - Belgrade, Serbia and Montenegro (14-17 May 2006)] 2006 25th International Conference on Microelectronics - Design Parameters Optimization Using Process Variations of the Pull-In Voltage for MEMs

Voicu, R., Tibeica, C., Bazu, M.

Year:

2006

Language:

english

File:

PDF, 420 KB

english, 2006

18

Microbial Applications (Recent Advancements and Future Developments) || 1. Microbial applications in the food industry

Kumar Gupta, Vijai, Zeilinger, Susanne, Ferreira Filho, Edivaldo X., Carmen Durán-Dominguez-de-Bazu, Maria, Purchase, Diane

Year:

2016

Language:

english

File:

PDF, 209 KB

english, 2016

19

[IEEE 2005 International Semiconductor Conference - Sinaia, Romania (3-5 Oct. 2005)] CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005. - Building an electrochemical micro-cell for micro-biosensors

Galateanu, L., Bazu, M., Ilian, V., Tibeica, C., Cimpoca, N., Podaru, C., Ardelean, I., Dumitru, L., Grigoras, M., Ivanoiu, M., Totolin, M., Conduruta, D.

Year:

2005

Language:

english

File:

PDF, 1.36 MB

english, 2005

20

Proceedings of Meetings on Acoustics [ASA ICA 2013 Montreal - Montreal, Canada (2 - 7 June 2013)] - Complexity index and proportional variability to study dolphin whistles

Bazúa Durán, Carmen, Sarmiento Ponce, E. Julieta, González Leal, Brenda P., Rodríguez Bohorquez, Camila

Year:

2013

Language:

english

File:

PDF, 146 KB

english, 2013

21

Molecular formulation of the internal viscosity in polymer dynamics, and stress symmetry

Bazúa, Enrique R.

Journal:

The Journal of Chemical Physics

Year:

1973

Language:

english

File:

PDF, 869 KB

english, 1973

22

[IEEE CAS '99 Proceedings. 1999 International Semiconductor Conference - Sinaia, Romania (5-9 Oct. 1999)] CAS '99 Proceedings. 1999 International Semiconductor Conference (Cat. No.99TH8389) - A preliminary study on VDMOS and IGBT encapsulation, reliability and lifetime killing

Badila, M., Jorda, X., Millan, J., Godignon, Ph., Banu, V., Brezeanu, Gh., Spenea, M.U., Staicu, L., Iliescu, E., Bazu, M., Codreanu, C.

Year:

1999

Language:

english

File:

PDF, 305 KB

english, 1999

23

Microbial Applications (Recent Advancements and Future Developments) || 4. Introspecting Bacteriophage Specificity and Decoding Phage Enzyme Non-Specificity for Antimicrobial Applications

Kumar Gupta, Vijai, Zeilinger, Susanne, Ferreira Filho, Edivaldo X., Carmen Durán-Dominguez-de-Bazu, Maria, Purchase, Diane

Year:

2016

Language:

english

File:

PDF, 235 KB

english, 2016

24

A combined fuzzy-logic and physics-of-failure approach to reliability prediction

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 459 KB

english, 1995

25

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - Behaviour of plastic encapsulated devices in marine environment

Dragan, M., Bazu, M.

Year:

1995

Language:

english

File:

PDF, 244 KB

english, 1995

26

[IEEE 2011 IEEE 17th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Timisoara, Romania (2011.10.20-2011.10.23)] 2011 IEEE 17th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Lifetime prediction for components with scarce data: The “worst case” approach

Bazu, M., Galateanu, L., Ilian, V. E., Varsescu, D.

Year:

2011

Language:

english

File:

PDF, 542 KB

english, 2011

27

[IEEE 2004 International Semiconductor Conference. CAS 2004 (IEEE Cat. No.04TH8748) - Sinaia, Romania (Oct. 4-6, 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - Reliability assessment by virtual prototyping of MEMS tunable fabry-perot optical cavity

Bazu, M., Tibeica, C., Galateanu, L., Ilian, V.

Year:

2004

Language:

english

File:

PDF, 212 KB

english, 2004

28

[IEEE 2009 International Semiconductor Conference (CAS 2009) - Sinaia, Romania (2009.10.12-2009.10.14)] 2009 International Semiconductor Conference - About using combined stresses for reliability testing of microsystems

Bazu, M., Galateanu, L., Ilian, V.

Year:

2009

Language:

english

File:

PDF, 547 KB

english, 2009

29

[IEEE 2014 37th ISSE International Spring Seminar in Electronics Technology (ISSE) - Dresden, Germany (2014.5.7-2014.5.11)] Proceedings of the 2014 37th International Spring Seminar on Electronics Technology - Influence of different methods of ageing on microstructure of solder joints

Pietrikova, A., Durisin, J., Bazu, M., Ilian, V.

Year:

2014

Language:

english

File:

PDF, 1.98 MB

english, 2014

30

[IEEE 6th International Conference on Optimization of Electrical and Electronic Equipments - Brasov, Romania (May 14-15, 1998)] Proceedings of the 6th International Conference on Optimization of Electrical and Electronic Equipments - The Reliability of Semiconductor Devices: An Overview

Year:

1998

Language:

english

File:

PDF, 487 KB

english, 1998

31

[IEEE 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Sinaia, Romania (7-11 Oct. 1997)] 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - MOVES-a method for monitoring and verifying the reliability screening

Bazu, M., Dragan, M., Dragan, L., Stoica, A.

Year:

1997

Language:

english

File:

PDF, 302 KB

english, 1997

32

Microbial Applications (Recent Advancements and Future Developments) || 12. Fungal cell factories and their applications

Kumar Gupta, Vijai, Zeilinger, Susanne, Ferreira Filho, Edivaldo X., Carmen Durán-Dominguez-de-Bazu, Maria, Purchase, Diane

Year:

2016

Language:

english

File:

PDF, 315 KB

english, 2016

33

Quantitative Accelerated Life Testing of MEMS Accelerometers

Bâzu, Marius, Gălăţeanu, Lucian, Ilian, Virgil, Loicq, Jerome, Habraken, Serge, Collette, Jean-Paul

Journal:

Year:

2007

Language:

english

File:

PDF, 602 KB

english, 2007

34

Microbial Applications (Recent Advancements and Future Developments) || 15. Improvement of functional attributes of kernels of wild legume Canavalia martima by Rhizopus oligosporus

Kumar Gupta, Vijai, Zeilinger, Susanne, Ferreira Filho, Edivaldo X., Carmen Durán-Dominguez-de-Bazu, Maria, Purchase, Diane

Year:

2016

File:

PDF, 432 KB

2016

35

[IEEE 2007 International Semiconductor Conference (CAS 2007) - Sinaia, Romania (2007.10.15-2007.09.17)] 2007 International Semiconductor Conference - Reliability Accelerated Testing of MEMS Acccelerometers

Bazu, Marius, Galateanu, Lucian, Ilian, Virgil Emil, Loicq, Jerome, Habraken, Serge, Colette, Jean-Paul

Year:

2007

Language:

english

File:

PDF, 1.82 MB

english, 2007

36

[IEEE International Semiconductor Conference - Sinaia, Romania (8-12 Oct. 2002)] Proceedings. International Semiconductor Conference - New control methods and process monitoring for improving performances of power diodes manufacturing

Galateanu, L., Bazu, M., Tibeica, C., Popa, E., Nichita, A., Turtudau, F.

Year:

2002

Language:

english

File:

PDF, 391 KB

english, 2002

37

[IEEE MELECON '94. Mediterranean Electrotechnical Conference - Antalya, Turkey (12-14 April 1994)] Proceedings of MELECON '94. Mediterranean Electrotechnical Conference - Simulation of the misfit elastic stress induced by implanted impurities in semiconductor wafers

Gaiseanu, F., Bazu, M., Plugaru, R.

Year:

1994

Language:

english

File:

PDF, 172 KB

english, 1994

38

[IEEE 2007 International Semiconductor Conference (CAS 2007) - Sinaia, Romania (2007.10.15-2007.09.17)] 2007 International Semiconductor Conference - Robust Assembling System for Photosynthesis-Based Microbiosensors

Galateanu, L., Cimpoca, N., Bazu, M., Ilian, V., Dinescu, A.

Year:

2007

Language:

english

File:

PDF, 2.02 MB

english, 2007

39

Microbial Applications (Recent Advancements and Future Developments) || List of Authors

Kumar Gupta, Vijai, Zeilinger, Susanne, Ferreira Filho, Edivaldo X., Carmen Durán-Dominguez-de-Bazu, Maria, Purchase, Diane

Year:

2016

File:

PDF, 66 KB

2016

40

Microbial Applications (Recent Advancements and Future Developments) || Preface

Kumar Gupta, Vijai, Zeilinger, Susanne, Ferreira Filho, Edivaldo X., Carmen Durán-Dominguez-de-Bazu, Maria, Purchase, Diane

Year:

2016

Language:

english

File:

PDF, 78 KB

english, 2016

41

[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - Optimizing the double diffusion process for power diodes manufacturing

Galateanu, L., Bazu, M., Tibeica, C., Popa, E., Nichita, A., Turtudau, F.

Year:

2001

Language:

english

File:

PDF, 831 KB

english, 2001

42

Microbial Applications (Recent Advancements and Future Developments) || 14. Cyanobacteria: biotechnological and environmental applications

Kumar Gupta, Vijai, Zeilinger, Susanne, Ferreira Filho, Edivaldo X., Carmen Durán-Dominguez-de-Bazu, Maria, Purchase, Diane

Year:

2016

Language:

english

File:

PDF, 480 KB

english, 2016

43

Failure Analysis (A Practical Guide for Manufacturers of Electronic Components and Systems) || Introduction

Bâzu, Marius, Băjenescu, Titu

Year:

2011

Language:

english

File:

PDF, 549 KB

english, 2011

44

[IEEE 2012 35th International Spring Seminar on Electronics Technology (ISSE) - Bad Aussee, Austria (2012.05.9-2012.05.13)] 2012 35th International Spring Seminar on Electronics Technology - Reliability testing of lead-free solder joints

Bazu, Marius, Ilian, Virgil Emil, Galateanu, Lucian, Varsescu, Dragos, Pietrikova, Alena

Year:

2012

Language:

english

File:

PDF, 304 KB

english, 2012

45

[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - Building a test schedule for automotive microsystems using accelerated testing models

Ilian, V.E., Dragan, M., Bazu, M., Socol, G.

Year:

2001

Language:

english

File:

PDF, 318 KB

english, 2001

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